Operational and Instrumentation Aspects of XRD

S. Kirti, V. Ranjan, G. Acharya, P. Prabhakar, K. Gaurav, N. Kumari, P. Y. Kommu, S. Jana, A. S. Bhattacharyya

Abstract


X-ray Diffraction (XRD) is an important tool to determine the crystallographic properties of materials. The instrumental and operational aspects has been dealt in this communication while XRD of AlΒ  and TiO2 powder with focus on scan speed, Ξ”2πœƒ, dwell second, KΞ² filter and mode of operation: coupled and decoupled πœƒ-2πœƒ mode.


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